Description

The key direction of JSC "NIIPP" is testing of microwave devices. The tests involve the entire experience of JSC "NIIPP" in this area, which is more than 50 years of development and production of microwave products, and the available equipment allows measurements in the frequency ranges up to 178.4 GHz.

The possibility of developing and manufacturing tools for testing and measurement of electronic components.

Equipment wiсth the most modern equipment for testing and measurements manufactured in the USA, Germany, France, Japan, Russia, etc.

Nomenclature of tested ITC ECB products of domestic and foreign production

resistors, capacitors, connectors, switching products;
transformers, chokes and inductors;
piezoelectric devices and Electromechanical filters;
semiconductor devices (case and case-free);
integrated circuits (case and case-free);
electronic modules (microwave modules, microwave integrated products);
optoelectronic devices, sign-synthesizing indicators;
ferrite microwave devices, products from ferrites and magnetodielectrics;
secondary power sources;
filters;
cables, cords, wires of means of communication and radio engineering devices

The direction of the testing centre of JSC "NIIPP»

Incoming inspection of electronic components:

inspection of appearance and marking;
control of overall and installation dimensions;
mass check;
control of electrical parameters;
x-ray control.

Additional testing of electronic components:
аааrejection tests: thermal training, electrical training, thermal Cycling, leak tests, control of the presence of foreign particles in the subcortical space;
diagnostic nondestructive testing: control of electrical parameters according to stricter standards, testing of products;
destructive physical analysis: internal visual inspection, pin strength tests, crystal shear tests, internal bond strength tests, soldering ability tests, scanning electron microscopy

Certification test:
to test the effect of mechanical factors: vibration, shock, single/repeated action;
climatic tests: high / low temperature, high humidity, high / low pressure;
reliability and persistence tests