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NTEGRA Nano IR
Ultralow drift advanced AFM-IR & s-SNOM imaging and spectroscopy.
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NT-MDT Spectrum InstrumentsDescription
- IR s-SNOM microscopy and spectroscopy with 10 nm spatial resolution
- Wide spectral range of operation: 3-12 μm
- Incredibly low thermal drift and high signal stability
- Versatile AFM with advanced modes: SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces)
- HybriD ModeTM - quantitative nanomechanical mapping
- Integration with microRaman (optional)
NT-MDT Spectrum Instruments presents NTEGRA Nano IR - scattering scanning near-field optical microscope (s-SNOM) designed for infrared (IR) spectral range.
AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis. Far-field component of the collected signal is suppressed by using lock-in techniques at cantilever oscillation frequencies. NTEGRA Nano IR system allows detection of near-field signal amplitude and phase. Spatial resolution of IR s-SNOM is about 10 nm and defined only by tip size.
- Wide spectral range of operation: 3-12 μm
- Incredibly low thermal drift and high signal stability
- Versatile AFM with advanced modes: SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces)
- HybriD ModeTM - quantitative nanomechanical mapping
- Integration with microRaman (optional)
NT-MDT Spectrum Instruments presents NTEGRA Nano IR - scattering scanning near-field optical microscope (s-SNOM) designed for infrared (IR) spectral range.
AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis. Far-field component of the collected signal is suppressed by using lock-in techniques at cantilever oscillation frequencies. NTEGRA Nano IR system allows detection of near-field signal amplitude and phase. Spatial resolution of IR s-SNOM is about 10 nm and defined only by tip size.